Fabrication of distributed C60 molecules reinforced Al nano-composite thin films was carried out on Si(100) wafer substrate using a conventional vacuum evaporation method. The evaporation sources were separated between C60 molecule powder and Al powder in order to prevent from the reaction between different original powders. The concentration of C60 molecule powder was changed ranging from 0.1 to 40 wt%. The structure analyses of all nano-composite films prepared by X-ray diffraction method showed aluminum crystalline structure and FT-IR analysis clarified the existence of C60 molecules contained in Al thin films. Cross-section TEM observations were carried out to evaluate the structure of the composite thin film. This result showed the uniform microstructure inside the composite films. From above results the uniform distribution of C60 molecules was obtained in Al matrix film. Nano-indentation studies showed that the hardness of Ai-1wt %C60 increased up to 3 times larger than that of Al film. The present result clearly indicates that high-strength nanocomposite thin metallic films reinforced by distributing C60 molecules should be developed.