AVS 60th International Symposium and Exhibition | |
Thin Film | Friday Sessions |
Session TF+EM+NS+SS-FrM |
Session: | Thin Film: Growth and Characterization III |
Presenter: | H. Kindlund, Linköping University, Sweden |
Authors: | H. Kindlund, Linköping University, Sweden J. Lu, Linköping University, Sweden I.G. Petrov, University of Illinois at Urbana Champaign J.E. Greene, University of Illinois at Urbana Champaign L. Hultman, Linköping University, Sweden |
Correspondent: | Click to Email |
V0.5Mo0.5Nx thin films with 0.55 ≤ x ≤ 1.03, as determined by RBS, are deposited on MgO(001) substrates by dual reactive magnetron sputtering. For the entire N composition range x, we obtain single-crystal B1-structure V0.5Mo0.5Nx, as determined by XRD and TEM analyses. RLM results indicate that the films are relaxed with lattice parameters varying from a = 4.12 Å for x = 0.55 to a = 4.19 Å for x = 1.03, increasing with increasing N content. The nanoindentation hardness H increases as N-vacancy concentration increases, from H = 18 GPa (x=1.03), to 20 GPa (x=0.94), 21 GPa (x=0.72), to 26 GPa (x=0.55), while the elastic modulus is maintained essentially constant. In addition, while nanoindented VN and TiN reference samples suffer from severe cracking typical of brittle ceramics, V0.5Mo0.5Nx films do not crack. Instead, they exhibit material pile-up around nanoindents, characteristic of plastic flow in ductile materials.