AVS 60th International Symposium and Exhibition | |
Scanning Probe Microscopy Focus Topic | Friday Sessions |
Session SP+AS+EM+GR+MI+NS+SS-FrM |
Session: | Probing Electronic and Transport Properties |
Presenter: | A. Bettac, Omicron NanoScience, Germany |
Authors: | A. Bettac, Omicron NanoScience, Germany B. Guenther, Omicron NanoScience, Germany J. Chrost, Omicron NanoScience, Germany J. Hilton, Omicron NanoScience, Germany J. Koeble, Omicron NanoScience, Germany A. Feltz, Omicron NanoScience, Germany |
Correspondent: | Click to Email |
A major challenge in the development of novel devices in nano- and molecular electronics is their interconnection with larger scale electrical circuits required to control and characterize their functional properties. Local electrical probing by multiple probes with STM precision can significantly improve efficiency in analyzing individual nano-electronic devices without the need of a full electrical integration. Recently we developed a microscope stage that merges the requirements of a SEM navigated 4-probe STM and at the same time satisfy the needs for high performance SPM at low temperatures.
Besides SEM/STM probe fine navigation and imaging with atomic resolution at temperatures of T<5K, the pm-stability of the LT NANOPROBE expands applications to tunneling spectroscopy and even the creation or modification of nanostructures or single atoms by a sharp and precise SPM probe. A further milestone in the development of the instrument was the implementation of the Qplus- NC-AFM mode for imaging on insulating surfaces. The Qplus measurement becomes important if nanowires/nanostructures are deposited on an insulating substrate for a better electrical decoupling of the nanowire from the substrate. In this case the Qplus sensor can be employed to locate the nanostructures and, after finding the structure, to carry out conductance measurements.
In this contribution we will present first Qplus results obtained with the LT Nanoprobe at low temperatures. Furthermore we will focus on measurements that prove the performance level of the instrument as well as on tunneling spectroscopy and atom manipulation experiments on Ag(111) at temperatures of T < 5K.