AVS 60th International Symposium and Exhibition | |
Scanning Probe Microscopy Focus Topic | Thursday Sessions |
Session SP+AS+BI+NS-ThP |
Session: | Scanning Probe Microscopy Poster Session |
Presenter: | N. Chung, Korea Research Institute of Standards and Science, Republic of Korea |
Authors: | N. Chung, Korea Research Institute of Standards and Science, Republic of Korea D.H. Kim, Pohang University of Science and Technology, Republic of Korea J.W. Park, Pohang University of Science and Technology, Republic of Korea |
Correspondent: | Click to Email |