AVS 60th International Symposium and Exhibition | |
Scanning Probe Microscopy Focus Topic | Thursday Sessions |
Session SP+AS+BI+EM+MI+NS+SE+SS-ThA |
Session: | Probe-sample Interactions, Nano-manipulation and Emerging Instrument Formats |
Presenter: | J.C. Thomas, University of California at Los Angeles |
Authors: | J.C. Thomas, University of California at Los Angeles J.J. Schwartz, University of California at Los Angeles H.S. Auluck, University of California at Los Angeles G. Tran, University of California at Los Angeles J. Gilles, University of California at Los Angeles S. Osher, University of California at Los Angeles C.A. Mirkin, Northwestern University P.S. Weiss, University of California at Los Angeles |
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