AVS 60th International Symposium and Exhibition | |
Scanning Probe Microscopy Focus Topic | Thursday Sessions |
Session SP+AS+BI+EM+MI+NS+SE+SS-ThA |
Session: | Probe-sample Interactions, Nano-manipulation and Emerging Instrument Formats |
Presenter: | M.B. Raschke, University of Colorado at Boulder |
Correspondent: | Click to Email |