| AVS 60th International Symposium and Exhibition | |
| Nanometer-scale Science and Technology | Tuesday Sessions |
| Session NS-TuP |
| Session: | Nanometer-scale Science and Technology Poster Session |
| Presenter: | I. Atsuro, Kanto Gakuin University, Japan |
| Authors: | I. Atsuro, Kanto Gakuin University, Japan R. Hoshiya, Kanto Gakuin University, Japan H. Kato, Kanto Gakuin University, Japan S. Takemura, Kanto Gakuin University, Japan T. Hiramatsu, Kanto Gakuin University, Japan |
| Correspondent: | Click to Email |
Fabrication of templates for creating nanoscale structures becomes an important subject for innovation of nanoscale devices. The authors proposed new types of nanoscale structures such as a linked-crater structure and highly-oriented line structure on Al surface by unique combination of chemical and electrochemical processes. In this study, the authors investigate the optical functionality of nanostructures by photoluminescence (PL) measurements. The nanoscale linked-crater structure was fabricated on an Al surface by treatment with Semi Clean, alkali surfactant, and successive electrochemical anodization in 0.37 N H2SO4 solution creating a nanoscale finer linked-crater structure on the Al surface. The PL spectra of non-ripple and ripple patterns were observed by using Horiba Jobin-Yvon Spex Fluorolog-3 fluorimeter. In the case of non-ripple pattern, the PL spectrum showed that the main peak appeared around 400 nm with a long tail slope linearly downwards that stretched up to 550 nm regions. In the case of the ripple pattern, the PL spectrum exhibited a pattern composed of several ripple peaks in 350-550 nm range. The samples that exhibited rippled PL pattern were prepared under the optimized fabrication conditions : anodization current 7-9 mA for 40 min for the sample size of 10 mm×20 mm. The peak positions were invariant with the change of excitation wavelength through 300-420nm. Thus, the ripple pattern was originated from the nanostructure origin. The absorbance measurement was also conducted. The ripple absorbance peaks were observed and overlapped partially the rippled emission peaks. The absorbance peak positions were invariant with the change of excitation wavelength.
Non ripple-shaped emission peaks were observed in the case of the samples prepared under deviated conditions. The fabricated nanostructured surfaces were identified as alumina by Fourier transforms infrared spectroscopy (FT-IR). The FT-IR measurement showed that the difference between the ripple and non-ripple PL patterns might be attributed to the peak profiles and the intensity of Al-O mode. In the ripple emission and non ripple pattern, the intensity of Al-O mode at 1170 cm-1 was different between two patterns. The lifetimes and the corresponding relative amplitudes were obtained by time-correlated single photon counting (TCSPC). In the case of ripple pattern, lifetimes and the relative amplitudes were definite values. On the other hand, in the non-ripple pattern, lifetimes and relative amplitudes were deviated from those values.
This work was aided by MEXT-supported Program for the Strategic Research Foundation at Private Universities.