AVS 60th International Symposium and Exhibition | |
Helium Ion Microscopy Focus Topic | Thursday Sessions |
Session HI-ThP |
Session: | Aspects of Helium Ion Microscopy Poster Session |
Presenter: | S. Lieb, University of Southern California |
Authors: | M. Schenk, Bielefeld University, Germany S. Lieb, University of Southern California H. Vieker, Bielefeld University, Germany A. Beyer, Bielefeld University, Germany A. Gölzhäuser, Bielefeld University, Germany H. Wang, University of Southern California K. Kohse-Höinghaus, Bielefeld University, Germany |
Correspondent: | Click to Email |
To explore the aforementioned problems and to find more suitable techniques, we report here results of two “softer” microscopic techniques: Helium Ion Microscopy (HIM) and phase imaging Atomic Force Microscope (AFM). In comparison to TEM, both techniques present far less sample damaging during imaging. The present study focuses on the HIM imaging of nanometer-sized soot particles sampled from a stagnation-point ethylene-oxygen-argon flame, under the conditions of Abid et al. (A. D. Abid, Combust.Flame 154 (2008) 775-788).