Paper EW-TuL3
Next Generation Data System for XPS

Tuesday, October 29, 2013, 12:40 pm, Room Hall A

Analytical instrumentation often has a large number of users with various operational and data processing skill levels. Modern software should allow both the novice and expert user to acquire the data they need while following the appropriate protocols. Although the concept of an expert system for x-ray photoelectron spectroscopy was suggested over a decade ago (Castle and Powell¹) the implementation of such expert systems is only just being realized.

In this presentation we will introduce a new generation data system which provides data dependent acquisition capability independent of the Users experience. Based on an initial survey spectrum the software is used to define the hardware acquisition parameters appropriate to the results required. Thus the software will provide the User with element identification and acquisition parameters appropriate to the requirements of either trace element detection or elemental/chemical state identification.

By allowing the software to determine the appropriate acquisition parameters for specific applications based on easy to define parameters such as signal to noise ratio the precision and accuracy of quantification from photoelectron spectra can be increased. This also ensures that the data acquired in a multiuser, non-expert environment is valid. Furthermore in line with protocols required for regulatory environments full traceability from raw data to quantified spectra is incorporated into the new data acquisition and processing software.

Reference

1. JE Castle, CJ Powell, SIA, Vol 35, Issue 3 p25-237