| AVS 60th International Symposium and Exhibition | |
| Applied Surface Science | Monday Sessions |
| Session AS+BI-MoM |
| Session: | Organic Depth Profiling |
| Presenter: | S.S. Alnabulsi, Physical Electronics Inc. |
| Authors: | S.S. Alnabulsi, Physical Electronics Inc. N. De Geyter, Ghent University, Belgium R. Morent, Ghent University, Belgium J.F. Moulder, Physical Electronics Inc. |
| Correspondent: | Click to Email |
Plasma modification of polymers is of great interest for surface preparation to enhance the covalent binding of functional groups and the surface adhesion in biomedical applications. The depth of the plasma treatment is expected to be limited to the top few nanometers, and in this this study, we are investigating the extent of oxygen incorporation through plasma surface modification of a polyethylene surface while varying treatment parameters, and examining the effects of aging on the stability of the modified layer.
Obtaining quantitative chemical state information of the extent of the plasma modification as a function of depth and determining the extent of the depletion region is accomplished through the application of XPS depth profiling utilizing two complimentary methods; the first is with the application of an angle dependent profile to probe the outer most layers of the modified surface, and the second is a sputter depth profile with C60 cluster ion beam.
We will present complimentary XPS results of angle dependent profiles and C60 sputter depth profile analyses of plasma modified polyethylene to reveal changes in the composition of the modified surface layers, which may explain the effects of varying the plasma treatment parameters, and the effects of sample aging on the shelf life of these modified polymers.