AVS 60th International Symposium and Exhibition
    Applied Surface Science Thursday Sessions
       Session AS+BI+EM+NL+NS+SS-ThM

Paper AS+BI+EM+NL+NS+SS-ThM4
Towards the Effective Combination of Static and Dynamic SIMS for Nanoparticle and Biological Analyses

Thursday, October 31, 2013, 9:00 am, Room 204

Session: Nanoparticle Surface Chemistry
Presenter: C. Szakal, National Institute of Standards and Technology
Correspondent: Click to Email
Static SIMS and dynamic SIMS experiments, protocols, instrumentation, and laboratory groups have largely developed in separate paths. As a result, it is common to think of certain application areas for a specific SIMS analysis, such as semiconductor depth profiling with dynamic SIMS and molecule-specific imaging with static SIMS. However, a combination of the two SIMS methodologies could generate a more complete data set by utilizing the surface-sensitive characteristics of ToF-SIMS with the enhanced signal dynamic range of large geometry (LG) dynamic SIMS. Benefits and potential pitfalls of such a combined analysis are discussed for nanoparticle surface chemistry vs. bulk measurements along with other biological application areas.