AVS 60th International Symposium and Exhibition | |
Atom Probe Tomography Focus Topic | Tuesday Sessions |
Session AP+AS+SS-TuA |
Session: | Microstructural and Interface Analysis of Metals Subjected to Various Conditions |
Presenter: | M.R. Keenan, Consultant |
Authors: | M.R. Keenan, Consultant V. Smentkowski, General Electric Global Research Center |
Correspondent: | Click to Email |