AVS 59th Annual International Symposium and Exhibition | |
Thin Film | Thursday Sessions |
Click a paper to see the details. Presenters are shown in bold type.
2:00pm | TF+AS+SS-ThA1 Atomic Force Microscopy (AFM)-Based Nanografting for the Study of Self-Assembled Monolayer Formation of Organophosphonic Acids on Al2O3 Single Crystal Surfaces B. Torun, B. Oezkaya, G. Grundmeier, University of Paderborn, Germany |
2:20pm | TF+AS+SS-ThA2 SIMS as a Method for Probing Stability of the Molecule-Substrate Interface in SAMs J. Ossowski, J. Rysz, Jagiellonian University, Poland, A. Terfort, Goethe University, Germany, P. Cyganik, Jagiellonian University, Poland |
2:40pm | TF+AS+SS-ThA3 Wet Chemical Surface Modification of Silicon Oxide and Oxide Free Silicon by Aluminum Oxide P. Thissen, A. Vega, T. Peixoto, Y.J. Chabal, University of Texas at Dallas |
3:00pm | TF+AS+SS-ThA4 Static and Dynamic Depth Profiling of Thin Films with Low Energy Ion Scattering (LEIS) H.R.J. ter Veen, M. Fartmann, Tascon GmbH, Germany, T. Grehl, ION-TOF GmbH, Germany, B. Hagenhoff, Tascon GmbH, Germany |
3:40pm | TF+AS+SS-ThA6 Invited Paper Paul Holloway Award Talk: Surface Chemistry and Structure of Alloy Thin Films under Reaction Conditions and their Correlations to Catalytic Performances of CO2 Conversion and Methane Partial Oxidation F. Tao, University of Notre Dame |
4:20pm | TF+AS+SS-ThA8 Time-resolved and Surface Plasmon Resonance Studies in Metal-Insulator Phase Transition in VO2 Thin Films L. Wang, C. Clavero, K. Yang, E. Radue, M.T. Simons, I. Novikova, R.A. Lukaszew, College of William and Mary |
4:40pm | TF+AS+SS-ThA9 Growth, Microstructure and Optical Properties of Sputter-Deposited Gallium Oxide Thin Films S.K. Samala, C.V. Ramana, The University of Texas at El Paso |
5:00pm | TF+AS+SS-ThA10 Optical and Structural Properties of Hafnium Oxide Thin Films Prepared Using Different Deposition Techniques L. Sun, N.R. Murphy, J.T. Grant, J.G. Jones, R. Jakubiak, Air Force Research Laboratory |
5:20pm | TF+AS+SS-ThA11 Nitrogen Induced Changes in the Structure and Electronic Properties of WO3 Thin Films C.V. Ramana, R.S. Vemuri, The University of Texas at El Paso, M. Engelhard, S. Thevuthasan, Pacific Northwest National Laboratory |