AVS 59th Annual International Symposium and Exhibition
    Electronic Materials and Processing Thursday Sessions

Session EM+SS+AS+NS-ThM
Nanoelectronic Interfaces, Materials, and Devices

Thursday, November 1, 2012, 8:00 am, Room 14
Moderator: M. Filler, Georgia Institute of Technology


  Click here to Download program book for this session  
  in Adobe Acrobat format  

Click a paper to see the details. Presenters are shown in bold type.

8:00am EM+SS+AS+NS-ThM1 Invited Paper
Tensilely Strained Ge Nanomembranes for Applications in Group-IV Infrared Photonics
R. Paiella, Boston University
8:40am EM+SS+AS+NS-ThM3
Self-activating and Self-limiting Features of the Thermally Assisted Growth Mechanisms of Thin Oxide-, Nitride- and Carbide Films on Si Surfaces at Low Gas or Plasma Pressures
P. Morgen, J. Drews, R. Dhiman, University of Southern Denmark, Z.S. Li, Aarhus University, Denmark
9:00am EM+SS+AS+NS-ThM4
Functional Conductive Polymer to Inexpensive and Portable Chemiresistive Biosensor
D. Bhattacharyya, K.K. Gleason, Massachusetts Institute of Technology
9:20am EM+SS+AS+NS-ThM5 Invited Paper
Semiconductor Nanomembranes for Biomedical Applications
J.A. Rogers, University of Illinois at Urbana Champaign
10:40am EM+SS+AS+NS-ThM9
Structure, Dynamics and Mechanism of a Single-Molecule Electric Motor
C.J. Murphy, C.H. Sykes, Tufts University
11:00am EM+SS+AS+NS-ThM10
Semiconductor Nanostructures for Efficient Thermoelectric Energy Conversion
Z. Aksamija, University of Wisconsin Madison
11:20am EM+SS+AS+NS-ThM11
UV Ozone Irradiation Induced Defect Formation in Graphene/PZT Devices
C.X. Zhang, D.M. Fleetwood, M.L. Alles, R.D. Schrimpf, Vanderbilt University, E.B. Song, S. Kim, K. Galatsis, K.L. Wang, University of California at Los Angeles, E.X. Zhang, Vanderbilt University
11:40am EM+SS+AS+NS-ThM12
Switching Molecular Kondo Effect by Chemical Reactions
H. Kim, ISSP, University of Tokyo, Japan, Y.H. Chang, KAIST, Korea, M.H. Chang, Korea University, Y.-H. Kim, KAIST, Korea, S.-J. Kahng, Korea University
12:00pm EM+SS+AS+NS-ThM13
Quantifying the Local Seebeck Coefficient using Scanning Thermoelectric Microscopy (SThEM)
J.C. Walrath, Y.H. Lin, K.P. Pipe, R.S. Goldman, University of Michigan