AVS 59th Annual International Symposium and Exhibition, Session EL+TF+AS+EM+SS+PS+EN+NM-MoM

AVS 59th Annual International Symposium and Exhibition
Spectroscopic Ellipsometry Focus Topic	Monday Sessions

Session EL+TF+AS+EM+SS+PS+EN+NM-MoM
Spectroscopic Ellipsometry for Photovoltaics and Semiconductor Manufacturing

Monday, October 29, 2012, 8:20 am, Room 19
Moderators: M. Creatore, Eindhoven University of Technology, the Netherlands, H. Wormeester, MESA+ Institute for Nanotechnology, Univeristy of Twente, Enschede, The Netherlands

Click here to Download program book for this session
in Adobe Acrobat format

Click a paper to see the details. Presenters are shown in bold type.

8:20am	EL+TF+AS+EM+SS+PS+EN+NM-MoM1 Invited Paper Multichannel Spectroscopic Ellipsometry: Applications in I-III-VI₂ Thin Film Photovoltaics R.W. Collins, D. Attygalle, P. Aryal, P. Pradhan, N.J. Podraza, University of Toledo, V. Ranjan, S. Marsillac, Old Dominion University
9:00am	EL+TF+AS+EM+SS+PS+EN+NM-MoM3 Contribution of Plasma Generated Nanoparticles to the Growth of Microcrystalline Silicon Deposited from SiF₄/H₂/Argon Gas Mixtures J.-C. Dornstetter, S. Kasouit, J.-F. Besnier, Total S.a, France, P. Roca i Cabarrocas, LPICM-CNRS, Ecole Polytechnique, France
9:20am	EL+TF+AS+EM+SS+PS+EN+NM-MoM4 Multichannel Spectroscopic Ellipsometry for CdTe Photovoltaics: from Materials and Interfaces to Full-Scale Modules P. Koirala, J. Chen, X. Tan, N.J. Podraza, The University of Toledo, S. Marsillac, Old Dominion University, R.W. Collins, The University of Toledo
9:40am	EL+TF+AS+EM+SS+PS+EN+NM-MoM5 Determination of Electronic Band Gaps from Optical Spectra R.A. Synowicki, J.A. Woollam Co., Inc.
10:00am	EL+TF+AS+EM+SS+PS+EN+NM-MoM6 Optical Modeling of Plasma-Deposited ZnO: Extended Drude and its Physical Interpretation H.C.M. Knoops, M.V. Ponomarev, J.W. Weber, N. Leick, B.W.H. van de Loo, Y.G. Melese, W.M.M. Kessels, M. Creatore, Eindhoven University of Technology, the Netherlands
10:40am	EL+TF+AS+EM+SS+PS+EN+NM-MoM8 The Ellipsometric Response of Single-Crystal Silicon to Doping H.G. Tompkins, Consultant
11:00am	EL+TF+AS+EM+SS+PS+EN+NM-MoM9 The Effect of Stress on the Optical Properties Semiconductor Films A.C. Diebold, G.R. Muthinti, M. Medikonda, T.N. Adam, College of Nanoscale Science and Engineering, University at Albany, A. Reznicek, B. Doris, IBM Research at Albany Nanotech
11:20am	EL+TF+AS+EM+SS+PS+EN+NM-MoM10 Numerical Ellipsometry: Spectroscopic n-k Plane Analysis of Thin Films Growing on Unknown Layered Substrates F.K. Urban, D. Barton, Florida International University