AVS 59th Annual International Symposium and Exhibition | |
Applied Surface Science | Thursday Sessions |
Click a paper to see the details. Presenters are shown in bold type.
2:00pm | AS-ThA1 Applications of a C60 Ion Source for Surface Chemical Analysis: It’s Not Just for Polymers W.F. Stickle, M.D. Johnson, D. Bilich, HP |
2:20pm | AS-ThA2 Towards Ultimate Organic Depth Profiling using Argon Cluster Beams – Recommendations for Dual Beam Profiling and Sample Charge Compensation R. Havelund, A.G. Shard, M.P. Seah, I.S. Gilmore, National Physical Laboratory, UK |
2:40pm | AS-ThA3 Comparative Study of C60 and Gas Cluster Ion Sputtering in XPS Depth Profiling for Thin Film Analysis S.S. Alnabulsi, J.F. Moulder, S.N. Raman, S.R. Bryan, J.S. Hammond, Physical Electronics |
3:00pm | AS-ThA4 Damage Profiles of Si (001) Surfaces Bombarded by Ar Gas Cluster Ion Beam J.G. Chung, D.J. Yun, Y.K. Kyoung, H.I. Lee, J.C. Lee, Samsung Advanced Institute of Technology, Republic of Korea, H.J. Kang, Chungbuk National University (CBNU), Republic of Korea |
3:40pm | AS-ThA6 Non-Destructive Depth Profiling using VKE-XPS and Maximum Entropy Regularization C. Weiland, J.C. Woicik, National Institute of Standards and Technology |
4:00pm | AS-ThA7 The Early Stage of Corrosion of Cu3Au Alloy P. Rajput, ESRF, France, A. Gupta, UGC-DAE Consortium for Scientific Research, India, C. Meneghini, Universita di“Roma Tre”, Italy, G. Sharma, UGC-DAE Consortium for Scientific Research, India, J. Zegenhagen, ESRF, France |
4:20pm | AS-ThA8 Invited Paper Hard X-ray Photoelectron Spectroscopy (HAXPES) Investigations of Electronic Materials and Interfaces J.C. Woicik, National Institute of Standards and Technology |
5:00pm | AS-ThA10 Hard X-ray Photoemission Spectroscopy used to Investigate the Resistive Switching Behavior of Manganite Heterostructures: The Case of Ti/PrCaTiO3 Interface F. Offi, CNISM and Dipartimento di Fisica, Università Roma Tre, Italy, F. Borgatti, CNR-ISMN, Bologna, Italy, Y. Yamashita, A. Yang, M. Kobata, K. Kobayashi, Synchrotron X-ray Station at SPring-8, NIMS, Japan, C. Park, A. Herpers, R. Dittmann, Peter Grünberg Institut, Research Center Jülich, Germany, G. Panaccione, CNR-IOM, Basovizza-Trieste, Italy |