AVS 58th Annual International Symposium and Exhibition
    Thin Film Division Monday Sessions

Session TF-MoM
Thin Films: Growth and Characterization I

Monday, October 31, 2011, 8:20 am, Room 107
Moderator: J.M. Fitz-Gerald, University of Virginia


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  in Adobe Acrobat format  

Click a paper to see the details. Presenters are shown in bold type.

8:20am TF-MoM1
Heavy Ion Irradiation Effects on Ti/Al Multilayer Thin Films
R.S. Vemuri, The University of Texas at El Paso, T. Varga, S.V. Shutthanadan, S.V.N.T. Kuchibhatla, M.H. Engelhard, P. Nachimuthu, C.H. Henager, C.M. Wang, S. Thevuthasan, Pacific Northwest National Laboratory, C.V. Ramana, The University of Texas at El Paso
8:40am TF-MoM2 Invited Paper
Flux and Surfactant-Assisted Physical Vapor Deposition: New Approaches for Improving Complex Oxide Thin Film Growth
J.-P. Maria, E.A. Paisley, B.E. Gaddy, North Carolina State University, M.D. Biegalski, Oak Ridge National Laboratory, D.L. Irving, A.R. Rice, R. Collazo, Z. Sitar, North Carolina State University
9:20am TF-MoM4
Initiated – Chemical Vapor Deposition of Organosilicones: from Growth Mechanism to Multilayer Moisture Diffusion Barriers
G. Aresta, J. Palmans, M.C.M. van de Sanden, M. Creatore, Eindhoven University of Technology, Netherlands
9:40am TF-MoM5
Processing and Characterization of Iron and Fluorine Co-Doped Ba0,6Sr0,4TiO3 Thin Films
F. Stemme, H. Gesswein, C. Azucena, Karlsruhe Institute of Technology (KIT), Germany, M. Sazegar, Darmstadt University of Technology, Germany, J.R. Binder, M. Bruns, Karlsruhe Institute of Technology (KIT), Germany
10:00am TF-MoM6
Advances in the Growth of Epitaxial Oxides for Neuromorphic Computing Applications
J.D. Greenlee, W.L. Calley, W.A. Doolittle, Georgia Institute of Technology
10:40am TF-MoM8
New Method to Produce High-Quality Epitaxial Ge on Si Using SiO2-Lined Etch Pits and Epitaxial Lateral Overgrowth for III-V Multijunction Solar Cells
D. Leonhardt, S.M. Han, University of New Mexico
11:00am TF-MoM9
Three Dimensional Reciprocal Space Measurements by X-ray Diffraction using Linear and Area Detectors: Application to Texture and Defect Determination in Oriented Thin Films and Nanoprecipitates
S. Gaudet, S. Lambert-Milot, P. Desjardins, École Polytechnique de Montréal, Canada, K. Dekeyser, C. Detavernier, Ghent University, Belgium, J.L. Jordan-Sweet, C. Lavoie, IBM T.J. Watson Research Center
11:20am TF-MoM10
Surface Characterization of Zr/Ti/Nb Tri-layered Films Deposited by Magnetron Sputtering on Si(111) and Stainless Steel Substrates
D.A. Tallarico, Federal University of Sao Carlos, Brazil, A.L. Gobbi, Brazilian Synchrotron Light Laboratory, Brazil, P.I. Paulin-Filho, Federal University of Sao Carlos, Brazil, A. Galtayries, Ecole Nationale Superieure de Chimie de Paris, France, P.A.P. Nascente, Federal University of Sao Carlos, Brazil
11:40am TF-MoM11
PECVD Synthesis of Hybrid Organic-Inorganic Nanolaminates
R. Patel, C.A. Wolden, Colorado School of Mines