| AVS 58th Annual International Symposium and Exhibition | |
| Vacuum Technology Division | Tuesday Sessions |
| Session VT+MN+NS+SS+AS-TuA |
| Session: | Surface Science for Future Electronic Materials and Accelerator Applications |
| Presenter: | Yulin Li, Cornell University |
| Authors: | Y. Li, Cornell University X. Liu, Cornell University J. Calvey, Cornell University J. Conway, Cornell University J.A. Crittenden, Cornell University M.A. Palmer, Cornell University J.P. Sikora, Cornell University S.De. Santis, Lawrence Berkeley National Laboratory |
| Correspondent: | Click to Email |
The performance of particle accelerators may be significantly limited due to buildup of electron cloud (EC) in the vacuum chambers. The EC buildup intensity is strongly affected by secondary electron emission from interior surfaces of the chambers. Application of coatings with reduced secondary electron yield (SEY) onto vacuum chamber interior surfaces is one of the most economical EC suppression techniques. As a part of the International Linear Collider (ILC) R&D program, the Cornell Electron Storage Ring (CESR) has been successfully reconfigured as a Test Accelerator (CesrTA) to study EC buildup and suppression techniques. During the CesrTA program, various passive SEY-reduction coatings (TiN, amorphous-carbon and diamond-like carbon thin films) have been applied to diagnostic vacuum chambers in CESR in order to evaluate the efficacy of the EC suppression and the vacuum performance of these coatings in an accelerator environment. These chambers are equipped with both vacuum instrumentation (ion gauges and residual gas analyzers), as well as EC diagnostics (retarding field analyzers and RF-shielded pickups). In this paper, we present the results of studies of the vacuum conditioning and EC mitigation performance of these coatings.