AVS 58th Annual International Symposium and Exhibition
    Thin Film Division Tuesday Sessions
       Session TF-TuP

Paper TF-TuP4
XPS and ToFSIMS Characterization of Laser Modified Films for Li-Ion Battery Cathodes

Tuesday, November 1, 2011, 6:00 pm, Room East Exhibit Hall

Session: Thin Films Poster Session
Presenter: Michael Bruns, Karlsruhe Institute of Technology, Germany
Authors: M. Bruns, Karlsruhe Institute of Technology, Germany
R. Kohler, Karlsruhe Institute of Technology, Germany
J. Proell, Karlsruhe Institute of Technology, Germany
C. Ziebert, Karlsruhe Institute of Technology, Germany
W. Pfleging, Karlsruhe Institute of Technology, Germany
Correspondent: Click to Email

The development of novel electrode materials for lithium-ion batteries has become subject of great interest in recent years due to the necessity of improved performance for future mobile applications and energy storage systems. Therefore, a great deal of effort has been spent to develop strategies for the enhancement of battery lifetime, capacity, and cyclability. A self-evident goal to improve the electrochemical properties of cathode materials is to enhance the lithium intercalation rate by increasing the surface to bulk ratio. For this purpose, a very promising approach is the laser-assisted surface modification and structuring of commonly as a cathode material used lithium cobalt oxide and lithium manganese oxide.

The present study focuses on the characterization of non-structured and laser modified films before and after electrochemical cycling using a combination of complementary surface analytical methods. For this purpose rf magnetron sputtered lithium cobalt oxide and lithium manganese oxide were structured with laser radiation leading to a surface microstructure with increased active surface area. In particular, high repetition excimer laser radiation with a pulse width of 4-6 nm and 248 nm wavelength was used. Self-organized conical microstructures were formed using laser fluences between 0.5 J/cm² and 2.0 J/cm². A subsequent annealing process using high power diode laser radiation at 940 nm wavelength enables the adjustment of the required crystallinity.

X-ray photoelectron spectroscopy (XPS) provides the chemical composition in a non-destructive manner. The in-depth distribution of the electrode constituents and the solid electrolyte interface after cycling was studied by time-of-flight secondary mass spectrometry (ToFSIMS) and XPS sputter depth profiles. In addition, the conical topography was shown by scanning electron microscopy (SEM) and crystallinity was proven by X-ray diffraction.