| AVS 58th Annual International Symposium and Exhibition | |
| Surface Science Division | Friday Sessions |
| Session SS-FrM |
| Session: | Surface Science on Graphene |
| Presenter: | Junepyo Oh, University of Tsukuba, Japan |
| Authors: | J.P. Oh, University of Tsukuba, Japan T. Kondo, University of Tsukuba, Japan K. Arakawa, University of Tsukuba, Japan Y. Saito, University of Tsukuba, Japan J. Nakamura, University of Tsukuba, Japan |
| Correspondent: | Click to Email |
The graphite surface consists of π conjugated system. When the π conjugated system is broken, the non-bonding π electronic states are known to form on the surface. Recently, the non-bonding π electronic states at the Fermi level of the graphite-related materials are expected to the active sites for the specific chemical reaction such as oxygen-reduction reaction in the fuel cell [1]. It is thus important to understand the interaction between an oxygen molecule and the graphite surface for the efficient usage of the graphite-related materials. We have reported previously that the defects induced by Ar+ ion bombardment on the graphite surface significantly affects the gas-graphite interaction based on the measurements of the angular intensity distributions of He and Ar beam scattered from the pristine and the defect induced graphite surfaces [2]. The difference in the gas-surface interaction has been ascribed to the local breaking of the π conjugated system of graphite by defect formation. To further investigate the effect of the modification of the graphite electronic states on the gas-surface interaction, especially for the oxygen adsorption, we have measured angular intensity distributions of O2 from electronically modified graphite surfaces, namely potassium intercalated graphite, nitrogen-doped graphite (graphite bombarded by N2+ ion) and defective graphite (graphite bombarded by Ar+ ion). The detail of scattering features as well as the effects of the electronic modification of graphite on the oxygen adsorption will be discussed in detail with our recent STM and STS results.
*E-mail: nakamura@ims.tsukuba.ac.jp [mailto:nakamura@ims.tsukuba.ac.jp]
[1] S.F. Huang, K. Terakura, T. Ozaki, T. Ikeda, M. Boero, M. Oshima, J. Ozaki and S. Miyata, Phys. Rev. B, 80, 235410 (2009).
[2] J. Oh, T. Kondo, D. Hatake, Y. Honma, K. Arakawa, T. Machida, J. Nakamura, J. Phys.: Condens. Matter, 22, 304008 (2010).