| AVS 58th Annual International Symposium and Exhibition | |
| Nanometer-scale Science and Technology Division | Monday Sessions |
| Session NS-MoA |
| Session: | Frontiers in Nanophotonics and Plasmonics |
| Presenter: | Wei David Wei, University of Florida |
| Authors: | W.D. Wei, University of Florida J. Wang, University of Florida Y. Wang, University of Florida G. Xiong, Pacific Northwest National Laboratory S. Peppernick, Pacific Northwest National Laboratory A. Joly, Pacific Northwest National Laboratory K. Beck, Pacific Northwest National Laboratory W.P. Hess, Pacific Northwest National Laboratory |
| Correspondent: | Click to Email |
Using two-photon photoemission electron microscopy (2P-PEEM) we have directly explored the optical fields on a single Ag nanostructure and quantitatively measured the field enhancement factor (FEF). The 2PPE intensity from the Ag nanostructure is enhanced by 2 orders of magnitude with respect to the 2PPE intensity from a smooth and homogeneous Ag thin film. This enhancement is attributed to a localized surface plasmon excitation and resonance of the local field, and the FEF is determined to be around 4. The capability of directly correlating the field enhancement with nanostructures makes 2P-PEEM a promising tool to investigate the fundamental optical properties of nanomaterials.