AVS 58th Annual International Symposium and Exhibition
    Helium Ion Microscopy Focus Topic Tuesday Sessions
       Session HI-TuP

Paper HI-TuP4
Analysis of Metal Nanoparticles in Biological Tissues Specimens Using the Helium Ion Microscope

Tuesday, November 1, 2011, 6:00 pm, Room East Exhibit Hall

Session: Aspects of Helium Ion Microscopy Poster Session
Presenter: Lauraine Denault, GE-GRC
Authors: V.S. Smentkowski, GE-GRC
L. Denault, GE-GRC
D. Wark, GE-GRC
L. Scipioni, Carl Zeiss SMT
D. Ferranti, Carl Zeiss SMT
Correspondent: Click to Email
The Helium Ion Microscope (HIM) is a newly introduced instrument that has a number of beneficial characteristics that are of importance for the analysis of biological/tissue samples, including: (1) the ability to perform high lateral resolution imaging, (2) high depth of field, (3) and the ability to analyze charging samples. In this poster, we summarize the first HIM analysis of spleen tissue samples that have been treated with a metal contrast agent. We show the advantages of HIM over techniques such as Scanning Electron Microscopy (SEM). The HIM analyis are complimented by surface analysis using Time of Flight Secondary Ion Mass Spectrometry (ToF-SIMS) in order to demonstrate that the contrast observed by HIM is indeed associated with the contrast agent.