| AVS 58th Annual International Symposium and Exhibition | |
| Graphene and Related Materials Focus Topic | Wednesday Sessions |
| Session GR-WeA |
| Session: | Graphene Characterization including Microscopy and Spectroscopy |
| Presenter: | Wondong Kim, Korea Research Institute of Standards and Science, Republic of Korea |
| Authors: | W. Kim, Korea Research Institute of Standards and Science, Republic of Korea K.-E. Yang, KRISS and Chunnam National Univ., Republic of Korea K. You, Korea Research Institute of Standards and Science, Republic of Korea S.J. Kim, Korea Research Institute of Standards and Science, Republic of Korea E.K. Seo, Korea Research Institute of Standards and Science, Republic of Korea C. Hwang, Korea Research Institute of Standards and Science, Republic of Korea |
| Correspondent: | Click to Email |
We investigated the surface atomic structure of a graphene layer grown on a single-crystal Cu(111) surface by using a chemical vapor deposition method. The low-energy electron diffraction pattern shows a clear ring structure, which indicates the existence of multiple domains with different in-plane orientations. In the scanning tunneling microscopy(STM) experiment, two domains showing different Moiré patterns and a domain boundary between them are observed. The misorientation angle between the domains was estimated from the quantum interference pattern around the domain boundary and the atom-resolved image of each domain. In the STM images of the domain boundary, the chain of protrusions was observed, which indicates the existence of localized electronic states originated from the pentagon or heptagon structures at the boundary.