| AVS 58th Annual International Symposium and Exhibition | |
| Graphene and Related Materials Focus Topic | Wednesday Sessions |
| Session GR-WeA |
| Session: | Graphene Characterization including Microscopy and Spectroscopy |
| Presenter: | Jürgen Rabe, Humboldt University Berlin, Germany |
| Authors: | J. Rabe, Humboldt University Berlin, Germany N. Severin, Humboldt University Berlin, Germany P. Lange, Humboldt University Berlin, Germany M. Dorn, Humboldt University Berlin, Germany S. Eilers, Humboldt University Berlin, Germany |
| Correspondent: | Click to Email |
Graphenes were used to cover solid substrates, including silicon wafers and atomically flat mica, pre-coated with molecularly thin liquids as well as single macromolecules. Optical reflection microscopy was employed to identify single graphenes on optically transparent substrates in optical reflection microscopy with a contrast of more than 12% [1]. A combined fluorescence and scanning force microscopy study revealed that that graphene is not only a highly conductive and transparent electrode, but also a most effective barrier to protect conjugated polymers against degradation through water and oxygen [2]. Time resolved pump-probe spectroscopy revealed ultrafast nonequilibrium carrier dynamics [3]. Finally, scanning force and electrostatic force microscopy, and also STM/STS were used to characterize structure and electronic properties of single graphenes with molecules either on top or below the graphene, revealing a remarkable stability of the elctronic properties of these hybrid systems.
[1] M. Dorn, P. Lange, A. Chekushin, N. Severin, J.P. Rabe, J. Appl. Phys. 108 (2010) 106101.
[2] P. Lange, M. Dorn, N. Severin, D. Vanden Bout, J.P. Rabe, Verhandlungen DPG Regensburg 2010.
[3] M. Breusing, S. Kuehn, T. Winzer, E. Malic, F. Milde, N. Severin, J.P. Rabe, C. Ropers, A. Knorr, T. Elsaesser, Phys. Rev. B (2011) 153410.