AVS 58th Annual International Symposium and Exhibition
    Graphene and Related Materials Focus Topic Monday Sessions
       Session GR-MoM

Paper GR-MoM5
Graphene Band Engineering on One-Dimensionally-Modulated SiC Substrate

Monday, October 31, 2011, 9:40 am, Room 208

Session: Graphene Growth
Presenter: Fumio Komori, University of Tokyo, Japan
Authors: K. Nakatsuji, University of Tokyo, Japan
T. Yoshimura, University of Tokyo, Japan
K. Morita, Kyushu University, Japan
S. Tanaka, Kyushu University, Japan
F. Komori, University of Tokyo, Japan
Correspondent: Click to Email

Engineering of the gapless graphene Dirac bands has been studied for understanding and useful applications of distinctive electronic properties due to their chiral nature. It has been theoretically shown that the group velocity of the bands can be tuned anisotropically by external potentials of a few tens nanometer scale. [1] A three-hold anisotropy of the conical band was found for a single-layer graphene modified by adsorbed metal clusters [2] while it was partly masked by the intrinsic trigonal warping of the bands. Here, we report uniaxial deformation of the Dirac cone of the single-layer graphene grown on a vicinal SiC(0001) substrate.

In the experiment, single-layer graphenes were thermally made by annealing in 5 x 10-5 Torr N2 gas at 1970 K for 1 sec on Si-terminated surfaces of nitrogen-doped 6H- and 4H-SiC(0001) substrates vicinal to the [1-100] direction. The tilting angle was either 4 degree for the 6H substrate or 8 degree for the 4H substrate. The terraces were elongated as confirmed by scanning tunneling and atomic force microscopes. The terrace widths in the [1-100] direction were 21 and 13 nm for the 4- and 8-degree-off substrates, respectively, while the width perpendicular to the [1-100] direction was commonly 100 nm.

The shapes of the graphene pi and pi* bands were studied using angle-resolved photoemission spectroscopy (ARPES) at 130 K. The graphene and reconstructed interface structures were confirmed by low energy electron diffraction (LEED) before the ARPES measurements, and we adjusted the orientation of the crystal axes using LEED. The Dirac point was 0.4 eV below Fermi energy EF as previously observed graphene grown on flat SiC(0001) substrates. The spectrum width of the graphene on the 8-degree-off substrate is larger than that on the 4-degree-off substrate because of the electronic scattering at the curved area of graphene on the substrate step edges as discussed for the graphene on a SiC(0001)substrate vicinal to the [11-20] direction. [3]

The constant-energy ARPES intensity maps of the pi and pi* bands for the graphene on the 4-degree-off substrate are trigonally warped, and almost agree with the previous reports. On the other hand, the intensity maps for the graphene on the 8-degree-off substrate are significantly elongate in the [1-100] direction. The group velocity of the pi* band in the G-K direction parallel to [1-100] is more than 20 % lower than the velocity in the other G-K directions. The velocity reduces in the direction parallel to the substrate slope in contrast to the theoretical prediction.[1]

References

1. C.-H. Park, L. Yang, Y.-W. Son, M. L. Cohen, and S. G. Louie, Nat. Phys. 4, 213 (2008).

2. S. Rusponi, M. Papagno, P. Moras, S. Vlaic, M. Etzkorn, P.M. Sheverdyaeva, D. Pacile, H. Brune and C. Carbone, Phys. Rev. Lett. 105 246803 (2010).

K. Nakatsuji, Y. Shibata, R. Niikura, F. Komori, K. Morita and S. Tanaka, Phys. Rev. B82 045428 (2010).