AVS 58th Annual International Symposium and Exhibition | |
Energy Frontiers Focus Topic | Wednesday Sessions |
Session EN+NS-WeM |
Session: | Organic Photovoltaics |
Presenter: | F. Douglas Pleticha, University of Illinois at Chicago |
Authors: | F.D. Pleticha, University of Illinois at Chicago L. Donghwa, University of Florida I.L. Bolotin, University of Illinois at Chicago S.R. Phillpot, University of Florida S.B. Sinnott, University of Florida L. Hanley, University of Illinois at Chicago |
Correspondent: | Click to Email |
The properties of semiconductor nanocrystal-organic films are of interest for applications in photodetectors, light-emitting diodes and photovoltaics. The versatility of these films arises from the ability to tune the bandgaps by adjusting the PbS nanocrystal size. Nanocrystalline photoelectric properties are also strongly affected by the chemical environment presented to them and by their bonding to the surrounding organic films. PbS nanocrystals are simultaneously deposited under vacuum into an organic matrix of evaporated α-sexithiophene while concomitantly modulating the film interface with 50 eV acetylene ions. Cluster beam deposition has been shown to allow the preparation of PbS nanocrystals that are surface terminated with either Pb or S [1]. Surface polymerization on ion assisted deposition (SPIAD) has shown an ability to increase the conjugation of oligothiophenes and otherwise lead to their chemical modification [2-4]. Cluster beam deposition and SPIAD are combined here to modulate the interface between the PbS and the organic matrix by introducing acetylene ions during the formation of the film. X-ray photoelectron spectroscopy analysis shows chemical shifts indicative of acetylene ion modulated interaction between the nanocrystals and sexithiophene. The deposition process was also simulated by a linearly scaled density functional theory method. These computer simulations indicate chemical bonding between the nanocrystals and sexithiophene, which is consistent with the chemical shifts observed by XPS.
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2. S. Tepavcevic, A. M. Zachary, A. T. Wroble, Y. Choi, and L. Hanley, J. Phys. Chem. A 110 (2006) 1618
3. S. tepavcevic, Y. Choi, and L. Hanley, Lang. 20 (2004) 8754
4. W. -D. Hsu, S. Tepavcevic, L. Hanley, and S. B. Sinnott, J. Phys. Chem. C 111 (2007) 4199