AVS 58th Annual International Symposium and Exhibition
    Biomaterial Interfaces Division Thursday Sessions
       Session BI-ThM

Paper BI-ThM4
XPS Sputter Depth Profiling of Organic Materials Using a Coronene Ion Source

Thursday, November 3, 2011, 9:00 am, Room 108

Session: Biomedical Materials
Presenter: Simon Hutton, Kratos Analytical Ltd, UK
Authors: S.J. Hutton, Kratos Analytical Ltd, UK
C.J. Blomfield, Kratos Analytical Ltd, UK
A.J. Roberts, Kratos Analytical Ltd, UK
S.C. Page, Kratos Analytical Ltd, UK
S.J. Coultas, Kratos Analytical Ltd, UK
C.E. Moffitt, Kratos Analytical Inc
D.J. Surman, Kratos Analytical Inc
Correspondent: Click to Email

Controlled release of active pharmaceutical molecules from biocompatible polymers over defined time periods is an area of intense study. Present applications include drug eluting stents and other drug delivery systems. One of the most important parameters which govern drug dosing is the drug concentration depth profile in the supporting polymer matrix. In a previous study we have shown that combining X-ray photoelectron spectroscopy (XPS) with a coronene ion source is a very powerful tool for investigating the drug distribution with depth of a model system [1].

The use of cluster ion sources for sputter depth profiling of thin film or multilayer organic materials during XPS analysis has become routine. A wide range of organic systems are amenable to profiling and there is a good understanding of the experimental parameters which contribute to successful analysis. Here we report on extending the aforementioned study to materials which closely resemble real world samples intended for use in vivo.

[1] A. Rafati, M.C. Davies, A.G. Shard, S. Hutton, G. Mishra, M.R. Alexander, J. Controlled Release, 2009, 138, 40–44