| AVS 57th International Symposium & Exhibition | |
| In Situ Microscopy and Spectroscopy Topical Conference | Tuesday Sessions |
Click a paper to see the details. Presenters are shown in bold type.
| 8:00am | IS+SS-TuM1 Oxidation and Reduction of Pd(100) and Supported Pd Nanoparticle Model Catalysts R. Westerstrom, S. Blomberg, N. Martin, J. Gustafson, E. Lundgren, J.N. Andersen, M.E. Messing, K. Deppert, Lund University, Sweden, H. Bluhm, Lawrence Berkeley National Laboratory, O. Balmes, R. van Rijn, ESRF Grenoble, France |
| 8:20am | IS+SS-TuM2 In-situ XPS Studies of CO2 Captured by Aqueous Monoethanolamine (MEA) Solutions T. Lewis, A. Chaudhuri, University of California, Irvine, M. Faubel, Max-Planck Institut fur Dynamik und Selbstorganisation, Germany, B. Winter, Helmholtz-Zentrum Berlin fur Materialien und Energie, Germany, J.C. Hemminger, University of California, Irvine |
| 8:40am | IS+SS-TuM3 Invited Paper Photoelectron Spectroscopy Under Humid Conditions H. Bluhm, Lawrence Berkeley National Laboratory |
| 9:20am | IS+SS-TuM5 Chemistry of Aminoacids at the Water – Metal Interfaces under UHV and AP Conditions A. Shavorskiy, Lawrence Berkeley National Laboratory, T. Eralp, The University of Reading, UK, F. Aksoy, Z. Liu, H. Bluhm, Lawrence Berkeley National Laboratory, A. Cornish, D. Watson, The University of Reading, UK, K. Schulte, J.N. Andersen, Lund University, Sweden, G. Held, The University of Reading, UK |
| 9:40am | IS+SS-TuM6 In-situ Ambient Pressure XPS Observations of Reversible Charge Storage in Ni Electrodes A.H. McDaniel, F. El Gabaly, Sandia National Laboratories, M. Grass, Z. Liu, Lawrence Berkeley National Laboratory, K.F. McCarty, Sandia National Laboratories, H. Bluhm, Lawrence Berkeley National Laboratory |
| 10:40am | IS+SS-TuM9 Invited Paper Hard X-ray Photoelectron Spectroscopy: an Effective Probe for Electronic Structure in Materials Science W. Drube, Deutsches Elektronen-Synchrotron DESY, Germany |
| 11:20am | IS+SS-TuM11 Novel Applications in Surface Science – In situ Sample Analysis in Extreme Environments A. Thissen, SPECS Surface Nano Analysis GmbH, Germany |