| AVS 57th International Symposium & Exhibition | |
| Exhibitors & Manufacturers Technology Spotlight | Tuesday Sessions |
Click a paper to see the details. Presenters are shown in bold type.
| 12:20pm | EW-TuL2 A Multi-technique Approach to the Characterization of Patterned Polymers Using ESCALAB 250Xi P. Mack, R.G. White, A. Wright, ThermoFisher Scientific, UK |
| 12:40pm | EW-TuL3 A New Cluster Ion Beam for Depth Profiling Challenging Organic Materials J.S. Hammond, Physical Electronics |
| 1:00pm | EW-TuL4 Recent Developments in X-ray Photoelectron Spectroscopy Data Acquisition and Processing D.J. Surman, C. Moffitt, Kratos Analytical Inc., C.J. Blomfield, A.J. Roberts, S.J. Hutton, G. Mishra, Kratos Analytical Ltd., UK |
| 1:20pm | EW-TuL5 Nanomechanical Testing in Electron Microscopes and the Vacuum Environment O.L. Warren, Hysitron, Inc. |