AVS 57th International Symposium & Exhibition | |
Applied Surface Science | Thursday Sessions |
Click a paper to see the details. Presenters are shown in bold type.
10:40am | AS2-ThM9 Invited Paper Characterization of Composition C4 Explosives using Time-of-Flight Secondary Ion Mass Sepctrometry (ToF-SIMS) and X-Ray Photoelectron Spectroscopy (XPS) C. Mahoney, K.L. Steffens, A.J. Fahey, B.A. Benner, National Institute of Standards and Technology, R.T. Lareau, Transportation Security Laboratory |
11:20am | AS2-ThM11 Chemical Speciation of Engineered Nanoparticle Surface Chemistry with Secondary Ion Mass Spectrometry C. Szakal, R.D. Holbrook, National Institute of Standards and Technology |
11:40am | AS2-ThM12 Complementary XPS and SEM/EDS Characterization of Gunshot Residue (GSR) A.J. Schwoeble, B.R. Strohmeier, J.D. Piasecki, RJ Lee Group, Inc. |