| AVS 57th International Symposium & Exhibition | |
| Applied Surface Science | Tuesday Sessions |
Click a paper to see the details. Presenters are shown in bold type.
| 2:20pm | AS-TuA2 Advanced Chemical State Analysis Method with Standard Spectra Measured with a Higher Energy Resolution of 0.1 % in Auger Electron Spectroscopy K. Tsutsumi, M. Shima, A. Tanaka, T. Tazawa, JEOL Ltd., Japan |
| 2:40pm | AS-TuA3 3D Atom Probe Analysis of Embedded Nanoclusters in Oxide Matrix S. Kuchihbatla, V. Shutthanandan, B. Arey, Pacific Northwest National Laboratory, R. Ulfig, T. Prosa, Cameca Instruments Inc., C.M. Wang, S. Thevuthasan, Pacific Northwest National Laboratory, P. Clifton, Cameca Instruments Inc. |
| 4:00pm | AS-TuA7 Imaging of Coal Speciation Using TOF-SIMS and Scanning Transmission X-Ray Microscopy (STXM) B.P. Yatzor, University at Buffalo, H.D. Liang, China University of Mining and Technology, China, J.A. Gardella Jr., University at Buffalo |
| 4:20pm | AS-TuA8 From Depth Profiling to FIB Sectioning for 3D TOF-SIMS Imaging of Organics G.L. Fisher, S.R. Bryan, Physical Electronics, P. Lu, General Motors Company, N. Smith, Oregon Physics, C. Szakal, NIST |
| 4:40pm | AS-TuA9 Mapping of a Polymer Surface Reaction: Determination of the Spatially Resolved, Hydrolytic Degradation Kinetics of a Micropatterned Bioresorbable Membrane M.D. Marchany, I.T. Ozbolat, B. Koc, J.A. Gardella, Jr., SUNY at Buffalo |
| 5:00pm | AS-TuA10 Approaches towards Analyzing XPS Multispectral Image Series (Multi-Sample Analysis) and Combining Multiple Spectroscopic, Microscopic and Macroscopic Analytical K. Artyushkova, University of New Mexico |
| 5:20pm | AS-TuA11 Invited Paper Atomic Scale Structural and Chemical Analysis of Internal Interfaces in Inorganic Materials B.P. Gorman, H.L. Guthrey, Colorado School of Mines, A.G. Norman, Y. Yan, M. Al-Jassim, National Renewable Energy Laboratory, R.P. O'Hayre, Colorado School of Mines |