|AVS 57th International Symposium & Exhibition|
|Nanometer-scale Science and Technology||Wednesday Sessions|
|Session:||Characterization and Imaging at Nanoscale|
|Presenter:||R. Wiesendanger, University of Hamburg, Germany|
|Correspondent:||Click to Email|
While Spin-Polarized Scanning Tunnelling Microscopy (SP-STM)  is nowadays well established for revealing atomic spin configurations at surfaces, its application is limited to electrically conducting samples such as magnetic metals or semiconductors. In order to map atomic spin structures at surfaces of insulators and to open up the exciting possibility of studying spin ordering effects with atomic resolution while going through a metal-insulator transition, we have developed Magnetic Exchange Force Microscopy (MExFM) . This technique is based on the detection of short-range spin-dependent exchange and correlation forces at very small tip-sample separations (a few Angstroms), in contrast to Magnetic Force Microscopy (MFM) where the magnetic dipole forces are probed with a ferromagnetic probe tip at a typical tip-to-surface distance of 10-20 nm . MExFM has allowed a first direct real-space observation of spin structures at surfaces of antiferromagnetic bulk insulators  as well as ultrathin films . Moreover, it provides a powerful new tool to investigate different types of spin-spin interactions based on direct-, super-, or RKKY-type exchange down to the atomic level. By combining MExFM with high-precision measurements of damping forces  localized or confined spin excitations in magnetic systems of reduced dimensions become experimentally accessible .
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