AVS 57th International Symposium & Exhibition
    In Situ Microscopy and Spectroscopy Topical Conference Tuesday Sessions
       Session IS+SS-TuA

Paper IS+SS-TuA10
In-Situ Heating, Imaging, and Analysis of Nanoparticles Using SEM, STEM, and XPS

Tuesday, October 19, 2010, 5:00 pm, Room Acoma

Session: In Situ Microscopy/Spectroscopy – Interfacial Chemistry/Catalysis
Presenter: J. Mastovich, RJ Lee Group, Inc.
Authors: J.L. Sturgeon, RJ Lee Group, Inc.
Z. Liu, University of Pittsburgh
K.L. Bunker, RJ Lee Group, Inc.
T.L. Lersch, RJ Lee Group, Inc.
J. Mastovich, RJ Lee Group, Inc.
B.R. Strohmeier, RJ Lee Group, Inc.
J.C. Yang, University of Pittsburgh
Correspondent: Click to Email
Use of an in-situ, semiconductor-based heating stage in high-resolution scanning electron microscope (SEM) and scanning transmission electron microscope (STEM) instruments permits rapid, but controlled, temperature changes and the ability to collect images and videos in real time with minimal drift. A Protochips AduroTM system utilized on a Hitachi S-5500 SEM/STEM allows analysis at elevated temperatures coupled with low voltage SEM/STEM imaging. Catalyst nanoparticles consisting of an iron core surrounded by a carbon shell have been studied using this technology. Elevated temperatures result in a variety of changes to the core-shell structure as well as migration and agglomeration of the iron nanoparticles. X-ray photoelectron spectroscopy (XPS) was also used to study the surface chemistry of these materials before and after heating. These experiments give critical insights into the kinetics of reaction of the iron nanoparticles. Additional analysis at higher accelerating voltages is possible using a dedicated STEM instrument. Other applications using elevated heating of nanoparticles will be discussed.