| AVS 56th International Symposium & Exhibition | |
| Nanometer-scale Science and Technology | Thursday Sessions |
Click a paper to see the details. Presenters are shown in bold type.
| 8:00am | NS-ThM1 Depth Resolved Luminescence from ZnO Nanowires R.A. Rosenberg, S. Vijayalakshmi, M. Abu Haija, Argonne National Laboratory, J. Zhou, J. Liu, S. Xu, Z.L. Wang, Georgia Institute of Technology |
| 8:20am | NS-ThM2 Scanning Chemical Microscopy of Nanoscale Roughness Formation in Photoresist Materials R. Ramos, I. Riisness, M. Gordon, University of California Santa Barbara |
| 8:40am | NS-ThM3 In Situ Nanoscale Characterization of Gas Fluxes of Organic Membranes by Flux-Lateral Force Microscopy L.S. Kocherlakota, D.B. Knorr, R.M. Overney, University of Washington |
| 9:00am | NS-ThM4 Nanoscale Electrodes by Conducting Atomic Force Microscopy at Elevated Temperatures M. Louie, California Institute of Technology, A. Hightower, Occidental College, S. Haile, California Institute of Technology |
| 9:20am | NS-ThM5 Invited Paper Unraveling Atomic Structures on CeO2(111) by Dynamic Force Microscopy M. Reichling, Universität Osnabrück, Germany |
| 10:40am | NS-ThM9 High-Resolution Atomic Force Microscopy in Three Dimensions U.D. Schwarz, M.Z. Baykara, T.C. Schwendemann, B.J. Albers, N. Pilet, E.I. Altman, Yale University |
| 11:00am | NS-ThM10 Looking Deeper: Multifunctional Scanning Probe Microscopy I. Riisness, R. Ramos, C. Carach, M. Gordon, University of California Santa Barbara |