| AVS 56th International Symposium & Exhibition | |
| Thin Film | Thursday Sessions |
| Session TF-ThM |
| Session: | Nanostructuring Thin Films II |
| Presenter: | D.I. Filoti, University of New Hampshire |
| Authors: | D.I. Filoti, University of New Hampshire A.R. Bedell, University of New Hampshire J.M.E. Harper, University of New Hampshire |
| Correspondent: | Click to Email |
We investigated the texture and microstructure evolution of Cu1-xAgx composite thin films through x-ray diffraction pole figures as a function of composition for x ≤ 0.5. As-codeposited at room temperature by magnetron sputtering, the fcc composite Cu1-xAgx emerge as a phase-segregated thin film, when the Ag volume fraction represents more than 15 at. % up to 50 at. %, or as a single phase thin film when Ag volume fraction represents less than 15 at. %. The texture evolution of Cu (111) and Ag (111) in phase-segregated Cu-Ag thin films proves to be synergistically enhanced when compared to pure copper or silver thin films. Not only is a stronger perpendicular (111) fiber texture obtained, but also an in-plane alignment of Ag (200) develops related to deposition direction and composition. By the use of transmission electron microscopy we observed a decrease in grain size in Cu-Ag composite films as compared with pure copper and silver films. These Cu-Ag thin films are being evaluated for antimicrobial applications.