AVS 56th International Symposium & Exhibition
    Advanced Surface Engineering Monday Sessions
       Session SE2-MoM

Paper SE2-MoM11
Time-resolved Plasma Characterization in Modulated Pulse Power (MPP) Magnetron Sputtering

Monday, November 9, 2009, 11:40 am, Room C4

Session: Pulsed Plasmas in Surface Engineering
Presenter: A.N. Cloud, University of Illinois at Urbana-Champaign
Authors: A.N. Cloud, University of Illinois at Urbana-Champaign
R.E. Flauta, University of Illinois at Urbana-Champaign
M.J. Neumann, University of Illinois at Urbana-Champaign
S.L. Rohde, University of Illinois at Urbana-Champaign
D.N. Ruzic, University of Illinois at Urbana-Champaign
Correspondent: Click to Email

High power impulse magnetron sputtering (HIPIMS/HPPMS) has attracted considerable attention from industry due its ability to produce thin films and features of excellent adhesion, superior density, decreased roughness, and extreme conformity. The intense pulsed plasma density – on the order of 1018 m-3 – provides a large concentration of metal ions that can be used to produce high-quality, homogeneous coatings. The high ionization fraction at the substrate allows for fine control of the sputtered species during deposition.

Modulated pulse power (MPP) can be employed to shape an arbitrary voltage waveform that is applied to the cathode. This programming freedom allows control over pulse duration, intensity, duty cycle, and average power. Voltage oscillations during the 1.0 – 3.0 ms pulse on the order of 25-65 kHz induce instabilities in the plasma discharge that may have a marked effect on the level of ionization within the discharge and distribution of the metal ions. The oscillation frequency range corresponds to the expected ion cyclotron angular frequencies. Past investigations of MPP have only revealed time-averaged plasma parameters, but knowledge of events during the pulse is required to further understanding of the physical mechanisms involved.

MPP discharges produced with a 1000 cm2 circular planar magnetron were characterized. A gridded energy analyzer and quartz crystal microbalance were used to measure a higher ionization fraction than with conventional magnetron sputtering under a variety of deposition conditions. Nominal values of approximately 6% were attained for the sputtering of titanium at power densities as low as 100 W/cm2. The energy spectrum and flux of these ions at the substrate location were also measured, finding the incident metal ions to be of low energy between 1 and 4 eV. Time-resolved plasma properties including saturation current, electron temperature, and density are measured and mapped over the three-dimensional space between the sputter target and substrate using a triple Langmuir probe. Plasma density is shown to decrease by greater than an order of magnitude between pulses. The effects of pulse duration, current density, pulse shape, switching frequency, and target material on the discharge are explored and discussed.