AVS 56th International Symposium & Exhibition
    Graphene Topical Conference Tuesday Sessions
       Session GR+EM+MS-TuM

Paper GR+EM+MS-TuM3
Air Induced Suppression of n-Type Conduction in Field-Effect Transistors

Tuesday, November 10, 2009, 8:40 am, Room C3

Session: Graphene and Carbon-based Electronics
Presenter: P. Levesque, Université de Montréal, Canada
Authors: P. Levesque, Université de Montréal, Canada
C.M. Aguirre, École Polytechnique de Montréal, Canada
M. Paillet, Université de Montréal, Canada
F. Lapointe, Université de Montréal, Canada
B.C. St-Antoine, École Polytechnique de Montréal, Canada
P. Desjardins, École Polytechnique de Montréal, Canada
R. Martel, Université de Montréal, Canada
Correspondent: Click to Email

Carbon nanotube, graphene, and organic semiconductor based devices share common features when exposed to atmospheric environment. For carbon nanotube field-effect transistors (FET), the effect is an almost exclusive p-type character in air. N-type conduction can only be observed under certain conditions, for instance when the devices are annealed in vacuum. By performing experiment under controlled atmosphere, we investigated the impact of the chemical nature of the substrate and of gas adsorbates on the field-effect switching behavior of both nanoscale and thin-film nanotube FETs. Our study revealed that the intrinsic material properties are modified and lead to the reduction of n-type conduction when an adsorbed water layer containing solvated oxygen is present on the SiO2 surface. This finding demonstrates that an electrochemical charge transfer reaction between the semiconducting channel and the aqueous oxygen redox couple is the underlying phenomenon behind the suppression of electron conduction in nanotube devices. The impact of this redox couple on graphene FET explored in this context will also be discussed. We forecast that these redox active species generally influence the transport properties of transistors operating in air and propose a general mechanism that explains behaviors observed in many material systems on SiO2/Si substrates, also including nanowires, polymers and organic materials.