| AVS 56th International Symposium & Exhibition | |
| Exhibitor Workshops | Tuesday Sessions |
| Session EW-TuL |
| Session: | Exhibitor Workshop |
| Presenter: | R.G. White, Thermo Fisher Scientific, UK |
| Authors: | R.G. White, Thermo Fisher Scientific, UK A.E. Wright, Thermo Fisher Scientific, UK J. Wolstenholme, Thermo Fisher Scientific, UK |
| Correspondent: | Click to Email |
Surface structure and chemistry are crucial to the successful production and operation of innumerable devices, materials and coatings. X-ray photoelectron spectroscopy, with its high surface specificity and chemical state sensitivity, is an ideal tool for the evaluation of material composition. XPS spectroscopic imaging, in which spectral data are acquired with some degree of lateral resolution, allows the identification of both spatial and chemical variations in materials. The expansive data sets that result from spectroscopic imaging must be treated with powerful software algorithms, to extract high levels of spatial and chemical information with a minimum of acquisition time.
Spectroscopic imaging solutions to structural and chemical problems are presented using the full range of state-of-the-art fully integrated X-ray Photoelectron Spectrometers from Thermo Fisher Scientific. Such analyses demonstrate the importance of small-scale structure on the integrity of a polymer blend, show the consequences of corrosion/dissolution of metallic and polymeric surfaces, and illustrate the nature of bonding failures. The effectiveness of spectroscopic imaging analyses, and intensive, automated data refinement processes using award-winning Avantage datasystem, are shown for each of these examples.