AVS 56th International Symposium & Exhibition
    Applied Surface Science Friday Sessions
       Session AS-FrM

Paper AS-FrM6
Characterization of Organic Light Emitting Devices Via Surface Analysis and Electron Microscopy

Friday, November 13, 2009, 10:00 am, Room C2

Session: Practical Surface Analysis
Presenter: D.J. Gaspar, Pacific Northwest National Laboratory
Authors: D.J. Gaspar, Pacific Northwest National Laboratory
A.S. Lea, Pacific Northwest National Laboratory
A.B. Padmaperuma, Pacific Northwest National Laboratory
Z. Zhu, Pacific Northwest National Laboratory
D.W. Matson, Pacific Northwest National Laboratory
L. Wang, Pacific Northwest National Laboratory
J. Berry, National Renewable Energy Laboratory
D.S. Ginley, National Renewable Energy Laboratory
Correspondent: Click to Email
The development of energy efficient organic light emitting devices (OLEDs) for solid state white lighting is a goal of the US Department of Energy. Key challenges facing the development of these materials include materials stability and device lifetime, particularly for blue phosphorescent devices, a necessary component of a white OLED device. Due to the high exciton energy necessary to generate blue light (i.e., quenching and side reactions more easily occur), the stability and lifetime of these devices is a particular challenge. There are many mechanisms by which a device may fail, including interfacial and bulk reactions, diffusion of components within or between layers, and structural and/or phase changes within one or more components. A great deal of work has been done to elucidate mechanisms of degradation, including through chemical and physical failure analysis of components and devices. We present here some of our work to elucidate chemical and physical changes in OLEDs devices and components using surface analysis and electron microscopy. We have used various tools including X-ray photoelectron spectroscopy (XPS), time of flight secondary ion mass spectrometry (TOF-SIMS), focused ion beam (FIB) combined with both electron microscopy (scanning and transmission), X-ray diffraction and atomic force microscopy (AFM, including conductive AFM). This talk will focus on characterization of devices incorporating new materials including transparent conducting oxides, host, and electron- and hole-transporting materials.