AVS 55th International Symposium & Exhibition
    Applied Surface Science Wednesday Sessions

Session AS-WeA
Frontiers of Analysis and Combined Materials

Wednesday, October 22, 2008, 1:40 pm, Room 207
Moderator: D.J. Gaspar, Pacific Northwest National Laboratory


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  in Adobe Acrobat format  

Click a paper to see the details. Presenters are shown in bold type.

1:40pm AS-WeA1 Invited Paper
Ambient Surface Mass Spectrometry – DESI – Towards a Metrological Framework
F.M. Green, National Physical Laboratory, UK, P. Stokes, G. O'Connor, LGC Ltd., UK, I.S. Gilmore, National Physical Laboratory, UK
2:20pm AS-WeA3
Shallow-Depth Surface Etching by Electrospray Droplet Impact
K. Hiraoka, Y. Sakai, D. Asakawa, University of Yamanashi, Japan, Y. Iijima, JEOL Ltd.
2:40pm AS-WeA4
Application of TOF-SIMS and LEIS for the Characterization of Ultra-Thin Films
T. Grehl, D. Rading, E. Niehuis, ION-TOF GmbH, Germany, R. ter Veen, H. Brongersma, Calipso BV, The Netherlands, M. Fartmann, B. Hagenhoff, TASCON GmbH, Germany
3:00pm AS-WeA5
Use of Ion-Solid Interaction Theory to Optimize FIB Processes
L.A. Giannuzzi, FEI Company
4:00pm AS-WeA8
C60 Bombardment of Si - New Insights from SIMS and TEM
G. Gillen, C. Szakal, A. Herzing, I. Anderson, National Institute of Standards and Technology, S. Hues, Micron Technology, J. Bennett, Process Characterization Laboratories, ATDF
4:20pm AS-WeA9
Understanding the Relationship between Chemical Vapor Deposition Precursor Structure and Film Properties by Application of Electron, Optical, Ion, and X-ray Characterization Methods
B.W. Schmidt, B.R. Rogers, R.D. Geil, Vanderbilt University
4:40pm AS-WeA10
The Interface Formation between Calcium and Poly(3-hexylthiophene) Investigated with Adsorption Microcalorimetry, High-Resolution XPS and ISS
F. Bebensee, Universitaet Erlangen, Germany, J.F. Zhu, University of Science and Technology of China, J.H. Baricuatro, J.A. Farmer, W. Lew, University of Washington, H.-P. Steinrueck, J.M. Gottfried, Universitaet Erlangen, Germany, C.T. Campbell, University of Washington
5:00pm AS-WeA11
Synthesis and Characterization of Core/Shell Nanoparticle Thin Films for Gas Analytical Microdevices
M. Bruns, M. Fuchs, R. Ochs, S. Schlabach, D.V. Szabó, Forschungszentrum Karlsruhe GmbH, Germany, T. Grehl, S. Kayser, ION-TOF GmbH, Germany, M. Fartmann, Tascon GmbH, Germany
5:20pm AS-WeA12
Molecular Depth Profiling for Soft Materials by using Size-Selected Large Cluster Ions
J. Matsuo, S. Ninomiya, H. Yamada, K. Ichiki, Y. Nakata, T. Aoki, T. Seki, Kyoto University, Japan