AVS 55th International Symposium & Exhibition | |
Thin Film | Thursday Sessions |
Session TF-ThM |
Session: | Evaporation, Pulsed Laser Deposition, and Molecular Beam Epitaxy |
Presenter: | D.L. Schulz, North Dakota State University |
Authors: | D.L. Schulz, North Dakota State University R.A. Sailer, North Dakota State University J. Leach, Sulzer Metco (US) R. Molz, Sulzer Metco (US) |
Correspondent: | Click to Email |
While most plasma spray routes to coatings utilize solids as the precursor feedstock, metal-organic precursor plasma spray (MOPPS) is an area that we have investigated recently as a novel route to thin film materials. Very thin films are possible via MOPPS and the technology offers the possibility of forming graded structures by metering the liquid feed. To date, liquid-based precursor plasma spray efforts have utilized solutions of metal salts or dispersed colloidal particles with a limitation of these approaches related to the fact that most of the plasma energy is expended toward evaporation/combustion of the solvent which starves this process of the energy required to promote film formation. The current work employs metal-organic compounds that are liquids at standard temperature-pressure conditions. In addition, these complexes contain chemical functionality that allows straightforward thermolytic transformation to targeted phases of interest. Toward that end, aluminum sec-butoxide (Al(OBu)3) and aluminum 3,5-heptanedionate (Al(hd)3) were used as precursors to alumina while triethylsilane (HSi(C2H5)3) and titanium tetrakisdiethylamide (Ti(N(C2H5)2)4) were employed for studies toward silicon carbide and titanium-nitride-carbide. In all instances, the precursors contain metal-heteroatom bonds envisioned to provide atomic concentrations of the appropriate reagents at the film growth surface thus promoting phase formation (e.g., Si-C bond in triethylsilane, Ti-N bond in titanium amide, etc.). Films were deposited using a Sulzer Metco Triplex Pro-200 Plasma Spray system under various experimental conditions using Design of Experiment (DoE) principles. The composition and morphology of these films was studied as a function of application conditions. Film compositions were analyzed by glancing incidence x-ray diffraction (GXRD) and elemental determination by x-ray spectroscopy (EDS). Silicon carbide and titanium-nitride-carbide films typically exhibited a continuous morphology with reasonable adhesion (i.e., passed tape pull adhesion test) while aluminum oxide films ranged from powdery to continuous but suffered from poor adhesion.