| AVS 55th International Symposium & Exhibition | |
| Synchrotron-based Spectroscopy and Spectro-Microscopy Topical Conference | Tuesday Sessions |
| Session SY+SS+BI-TuA |
| Session: | Synchrotron-based Spectroscopy and Spectro-Microscopy |
| Presenter: | A. Perucchi, Sincrotrone Trieste, Italy |
| Authors: | A. Perucchi, Sincrotrone Trieste, Italy S. Lupi, CNR-INFM Coherentia and Universita' di Roma "La Sapienza", Italy D. Eichert, Sincrotrone Trieste, Italy L. Vaccari, Sincrotrone Trieste, Italy M. Kiskinova, Sincrotrone Trieste, Italy |
| Correspondent: | Click to Email |
The infrared beamline SISSI (Source for Imaging and Spectroscopic Studies in the Infrared) at Elettra extracts the infrared and visible components of synchrotron emission for applications of spectroscopy, microspectroscopy and imaging. The applications cover a wide range of research fields, including surface and material science, biochemistry, forensics, geology, biomedicine, microfluidics. We will overview the characteristics of the beamline and discuss recent results. A particular focus will be devoted to the new research opportunities in infrared spectroscopy at high pressures and in the THz range.