| AVS 55th International Symposium & Exhibition | |
| Synchrotron-based Spectroscopy and Spectro-Microscopy Topical Conference | Tuesday Sessions |
| Session SY+SS+BI-TuA |
| Session: | Synchrotron-based Spectroscopy and Spectro-Microscopy |
| Presenter: | B.M. Haines, University of Saskatchewan, Canada |
| Authors: | B.M. Haines, University of Saskatchewan, Canada T. Tyliszczak, Lawrence Berkeley National Laboratory S. Beyhan, University of Saskatchewan, Canada S.G. Urquhart, University of Saskatchewan, Canada |
| Correspondent: | Click to Email |
Scanning transmission x-ray microscopy (STXM) is a powerful technique that allows for near edge x-ray absorption spectroscopy (NEXAFS) and imaging with chemical speciation at spatial resolutions better than 50 nm. STXM has seen widespread use to study polymers, biological systems, and geochemistry. Many synchrotrons now have at least one beamline dedicated to STXM. It is however a bulk technique with limited surface sensitivity, as such it is not ideal for studying surface phenomenon or monolayers such as Langmuir-Blodgett films where the signal is very weak. Recently we have modified STXM microscopes at the Canadian Light Source and the Advanced Light Source to perform total electron yield (TEY) NEXAFS, which is well suited for studying surface phenomena. We have used TEY-STXM for compositional mapping of phase separated Langmuir-Blodgett films of arachidic acid and perfluorotetradecanoic acid. The films are imaged with the same resolution as STXM with increased contrast and surface sensitivity. TEY-STXM has been used to obtain simultaneous transmission and TEY spectra in addition to compositional maps of Fe3O4 carbon supported nanoparticles less than 75 nm in size. The modification of STXM for TEY detection represents a significant new tool for studies conducted with STXM and opens the window for surface sensitive measurements with STXM.