| AVS 55th International Symposium & Exhibition | |
| Surface Science | Thursday Sessions |
| Session SS-ThP |
| Session: | Poster Session |
| Presenter: | G. Kibelka, O.I. Analytical CMS Field Products |
| Authors: | O. Hadjar, O.I. Analytical CMS Field Products G. Kibelka, O.I. Analytical CMS Field Products |
| Correspondent: | Click to Email |
Photon imaging based on charged coupled devices (CCD) is a mature technology. Such detectors are used, for instance, in astrophysics instruments as well as in every day consumer products. As a consequence, the CCD underlying functionality is well understood and devices can easily be mass-produced. The common CCD is a fine-pitched, two-dimensional array detector, which can be operated in a vacuum as well as under high pressure. Replacement of the photosensitive layer of the CCD with a metal-oxide semiconductor (MOS) has proven to be a very successful and promising technique for ion imaging. Various instruments based on charge detection can benefit from such a device, particularly mass spectrometers (MS). Fusing the CCD with a miniaturized Matauch-Herzog type MS1 results in a compact sector-field mass spectrometer with sufficient mass resolution and unmatched duty cycle. Using an electron-impact ion source, formed ions are m/z separated and detected by our CCD located at the focal plane of our instrument. The CCD response can be studied as a function of ion energies and incidence angles. Quantum efficiencies of singly and doubly charged rare gas ions are being investigated and results are compared with electron-impact ionization cross section found in literature.2 These fundamental studies will increase the accuracy of quantifying abundances of ionic species and can be the base for future improvements.
1 M. P. Sinha, M. Wadsworth. Rev. Sci. Ins. 76, 025103 (2005).
2 A. Kobayashi, G. Fujiki, A. Okaji, T. Masuoko. J. Phys. B: At. Mol. Phys. 35 2087 (2002).