| AVS 55th International Symposium & Exhibition | |
| Advanced Surface Engineering | Thursday Sessions |
| Session SE-ThP |
| Session: | Advanced Surface Engineering Poster Session |
| Presenter: | M. Dhayal, University of Washington |
| Authors: | R.R. Pandey, National Physical Laboratory, India K.K. Saini, National Physical Laboratory, India M. Dhayal, University of Washington C. Chander Kant, National Physical Laboratory, India S.C. Jain, National Physical Laboratory, India |
| Correspondent: | Click to Email |
In this study tungsten ion doped nanocrystalline TiO2 thin films has been fabricated using dip-coating technique on glass substrates. Surface structure and chemistry of the films was characterized using X-ray diffraction, transmission / scanning electron microscopy, UV-visible spectroscopy, X-ray photoelectron spectroscopy and FTIR. The tungsten ions doping in the film have significant influence on the morphology and surface chemistry. These nanocrystalline films have shown improved activity on the oxidation of organic pollutants possibly due to enhanced surface area with more active site in presence of tungsten.