|AVS 55th International Symposium & Exhibition|
|In Situ Microscopy and Spectroscopy: Interfacial and Nanoscale Science Topical Conference||Thursday Sessions|
|Session:||In Situ Spectroscopy – Dynamic Nanoscale Processes|
|Presenter:||J.M. Vaughn, Ohio University|
|Authors:||J.M. Vaughn, Ohio University
M.E. Kordesch, Ohio University
|Correspondent:||Click to Email|
A transmission electron microscope fitted with a home-built nano manipulator for in situ mechanical deformation of nanobelts is reported. Nanobelts of beta Ga2O3 are grown by the vapor transport method from gallium metal in an argon gas flow at 950 degrees centigrade. A single 2.5 um wide, approximately 200 nm thick and 10’s of microns long belt is deformed by direct contact with the manipulator probe. Deflections of up to 180 degrees are possible without fracture of the belt. A series of TEM diffraction patterns are collected during belt deformation. The diffraction pattern is observed to distort as the belt is deformed. In addition to the distortion of the monoclinic belt diffraction pattern, additional diffraction spots are observed through belt deformation. Analysis of the additional spots and deflection in preexisting spots reveal simultaneous lengthening and contracting in measured planar spacings. This data is modeled by lattice deformations, which allows for such a large deformation of the belt. The lattice deformation model results in the lattice constant ‘c’ having two simultaneous values for any given diffraction pattern. The maximum simultaneous deformation in ‘c’ is measured to be 11.3 and 16.3 Angstroms. Lattice constant ‘a’ behaves similarly with values 5.1 and 7.9 Angstroms. Finally, the lattice deformation model is compared to a plane slipping model, which may also explain the additional spots and deformation.
Funded by a 2005 AVS Undergraduate Research Award.