Paper EW-WeM2
New Advances in Raman Microscopy Instrumentation

Wednesday, October 22, 2008, 10:20 am, Room Exhibit Hall

Raman microscopy provides valuable and important information about the molecular composition of a material under investigation. This information is complementary to other recognized techniques for material analysis such as SEM and XPS and as such augments the information provided by these and other technologies. This presentation will highlight the recent advances in Raman micrsocopy instrumentation that have yielded instruments that are no longer instruments for only dedicated Raman researchers but are analytical tools that can also be effectively used by the non expert. Examples will also be presented that displays the applicability and importance of Raman microscopy in the field of materials characterization.