Paper EM-ThA8
Soft X-Ray Spectroscopic Studies of the Electronic Structure of Cu(tfacac)₂en (TFAC)

Thursday, October 23, 2008, 4:20 pm, Room 210

The valence and core level electronic structure of the organic molecule Cu(tfacac)₂en, or TFAC, has been measured using synchrotron radiation-excited resonant x-ray emission spectroscopy (RXES) and x-ray photoelectron spectroscopy (XPS). Samples were in the form of thin films, grown in-situ in an organic molecular beam deposition chamber attached to the spectrometer system. The thin films were characterized with scanning electron microscopy (SEM) after growth, and ordering is observed that is consistent with expectations for molecular beam deposition. The films were found to be sensitive to photon induced beam damage, but this problem could be alleviated by continuous translation of the films during measurement. Our measurements indicate that TFAC potentially has semiconducting properties, and may compare favorably with copper phthalocyanine as an organic semiconductor. Work supported in part by the AFOSR.