| AVS 55th International Symposium & Exhibition | |
| Electronic Materials and Processing | Thursday Sessions |
| Session EM-ThA |
| Session: | Organic Electronics |
| Presenter: | L.S. Wielunski, Rutgers University |
| Authors: | L.S. Wielunski, Rutgers University S. Katalinic, Rutgers University B. Lee, Rutgers University V. Podzorov, Rutgers University E. Garfunkel, Rutgers University L.C. Feldman, Rutgers University |
| Correspondent: | Click to Email |
It has been recently observed that electrical conductivity of small-molecule organic semiconductors (such as Rubrene) can be strongly enhanced in the presence of fluorinated silane SAM at the surface.1 In order to understand the microscopic origin of this large electronic effect and to resolve the exact SAM composition, we have performed Rutherford Backscattering Spectrometry (RBS) of SAM-rubrene and SAM-polymer systems using 2 MeV He ions. RBS allows a determination of the fluorine and silicon concentrations in a monolayer-thick film formed at the surface of organic crystals and polymers. Preliminary results indicate a modified SAM composition upon adsorption, possibly due to new interfacial chemistry or possibly due to beam induced effects. The analytical results will be compared with electrical measurements of SAM-induced conductivity in organic semiconductors.
1 M. F. Calhoun, J. Sanchez, D. Olaya, M. E. Gershenson and V. Podzorov, Nature Mat. 7, 84 (2008).