| AVS 55th International Symposium & Exhibition | |
| Biological, Organic, and Soft Materials Focus Topic | Tuesday Sessions |
| Session BO-TuP |
| Session: | Biological, Organic, and Soft Materials Focus Topic Poster Session |
| Presenter: | H.K. Moon, University at Buffalo |
| Authors: | H.K. Moon, University at Buffalo J.A. Gardella, University at Buffalo |
| Correspondent: | Click to Email |
Time of flight secondary ion mass spectrometry (TOF-SIMS) is a powerful technique that can be used to investigate the conformation at the surface of a polymer film. Since the late 1990’s TOF-SIMS studies of polymer tertiary structure have been reported for only a few polymers.1-4 In this study, poly(methylphenylsiloxane) (PMPhS) is studied as another candidate polymer. The films which have the different conformations were manufactured by using Langmuir technique and solution cast method. For these different films, the difference of the fragment ion clusters in the high mass range of TOF-SIMS spectrum was investigated and additionally, reflection-absorption Fourier transform infrared spectroscopy (RA-FTIR) was used to confirm the result of ToF-SIMS. However, previous ToF-SIMS studies of tertiary structures of the polymers at their surface have been limited to the fundamental Langmuir model system.1-4 Thus, the tertiary structure of poly(dimethylsiloxane) (PDMS) in a more realistic model will be investigated by using ToF-SIMS. First, the tertiary conformations of PDMS monolayers on a polystyrene (PS) substrate, as determined from high mass fragment intensity ratios4 are determined. Then, the conformations of PDMS blocks, in a PS-PDMS-PS block copolymer, segregated at the surface of blends of PDMS-PS block copolymer and PS homopolymer are determined.5 Thus, the PDMS film on the PS substrate can be regarded to the intermediate model between PDMS in the fundamental Langmuir film and PDMS segregated at the surface of a PDMS/PS copolymer or blend film.
1 Nowak, R. W.; Gardella, J. A., Jr.; Wood T. D.; Zimmerman P. A.; Hercules D. M. Anal. Chem. 2000, 72, 19, 4585.
2 Yan W.-Y.; Gardella, J. A., Jr. Secondary Ion Mass Spectrometry; John Wiley and Sons: New York, 1998, 451.
3 Rey-Santos, R.; Piwowar, A. M.; Alvarado, L. Z.; Gardella, J. A., Jr. Appl. Surf. Sci. 2006, 252, 19, 6605.
4 Piwowar, A. M.; Gardella, J. A., Jr. Anal. Chem. 2007, 79, 4126.
5 Xian, C.; Gardella, J. A., Jr. Macromolecules 1994, 27, 3363.